The final session will be a presentation on examples of RF exposure problems, including measurement equipment and techniques that take into account operator-induced uncertainty, presented by Doczkat ...

Semiconductor test engineers can expect to increasingly confront problems related to RF, memory, and compression-based-scan test; timing and jitter measurements; design for manufacturability (DFM); ...

Very Inexpensive RF Module Tutorial 39 Comments by: Brian Benchoff August 19, 2012 ...